Search results for " Semiconductor quantum dot"

showing 2 items of 2 documents

Temperature dependence of the E2h phonon mode of wurtzite GaN/AlN quantum dots

2008

Raman scattering has been used to study the temperature dependence of the frequency and linewidth of the E2h phonon mode of GaN/AlN quantum dot stacks grown on 6H-SiC. The evolution of the nonpolar phonon mode was analyzed in the temperature range from 80 to 655 K for both quantum dots and barrier materials. The experimental results are interpreted by comparison with a model that takes into account symmetric phonon decay and the different thermal expansions of the constituents of the heterostructure. We find a small increase in the anharmonic parameters of the phonon modes in the heterostructure with respect to bulk. jorbumar@alumni.uv.es Alberto.Garcia@uv.es Ana.Cros@uv.es

III-V semiconductorsMaterials scienceCondensed matter physicsPhononUNESCO::FÍSICAGallium compoundsGeneral Physics and AstronomyHeterojunctionAluminium compounds ; Gallium compounds ; III-V semiconductors ; Phonons ; Raman spectra ; Semiconductor quantum dots ; Thermal expansionAtmospheric temperature rangeCondensed Matter::Mesoscopic Systems and Quantum Hall EffectCondensed Matter::Materials Sciencesymbols.namesakeLaser linewidth:FÍSICA [UNESCO]Quantum dotsymbolsPhononsSemiconductor quantum dotsRaman spectraThermal expansionRaman spectroscopyAluminium compoundsRaman scatteringWurtzite crystal structureJournal of Applied Physics
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Size dependent light absorption modulation and enhanced carrier transport in germanium quantum dots devices

2015

Quantum confinement in closely packed arrays of Ge quantum dots (QDs) was studied for energy applications. In this work, we report an efficient tuning mechanism of the light harvesting and detection of Ge QDs. Thin films of SiGeO alloys, produced by rf-magnetron sputtering, were annealed at 600 degrees C in N-2 to induce precipitation of small amorphous Ge QDs into the oxide matrix. Varying the Ge content, the QD size was tailored between 2 and 4 nm, as measured by high resolution transmission electron microscopy. X-ray photoelectron spectroscopy (XPS) measurements indicate the formation of pure SiO2, as well as the presence of a sub-stoichiometric Ge oxide shell at the QD interface. Light …

Precipitation (chemical)Materials scienceAmorphous alloyBand gapchemistry.chemical_elementHigh resolution transmission electron microscopyPhotoconductive gainGermaniumNanocrystalMetal-insulator semiconductor deviceSettore ING-INF/01 - ElettronicaSettore FIS/03 - Fisica Della MateriaAbsorption spectroscopyQuantum confinement effectQuantum confinementElectromagnetic wave absorptionLight absorptionThin filmGermanium oxideOxide filmHigh-resolution transmission electron microscopyGermanium quantum dotPotential wellMIS deviceAmorphous filmGermaniumQuantum dotsRenewable Energy Sustainability and the Environmentbusiness.industryPhotoconductivitySolar cellPreferential trappingMIM deviceSemiconductor deviceSurfaces Coatings and FilmsElectronic Optical and Magnetic MaterialsPhotovoltaicschemistryMetal insulator boundarieQuantum dotrf-Magnetron sputtering Semiconductor quantum dotOptoelectronicsCharge carrierX ray photoelectron spectroscopy Effective mass approximationbusinessQuantum chemistryPhotovoltaicMagnetron sputteringSolar Energy Materials and Solar Cells
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